Some remarks on the paper “Optimization of S:Sn precursor molar concentration on the physical properties of spray deposited single phase Sn₂S₃ thin films” by J. Srivind, V.S. Nagaretthinam, A.R. Balu [Mater. Sci.-Poland, 34 (2016), 393 – 398]

Data publikacji: 12 gru 2020

Zakres stron: 400 - 401

Otrzymano: 14 kwi 2018

Przyjęty: 13 lis 2018

DOI: https://doi.org/10.2478/msp-2018-0101

Słowa kluczowe

X-ray diffraction, thin films, errors, SnS

© 2020 Paweł E. Tomaszewski, published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.