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The Deposition Temperature Dependence on the Crystallite Size of NiO Thin Films


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In this article, we have investigated a fitting proposal model for calculating the crystallite size of pure NiO thin films by varying the structural parameters, such as full width at half-maximum β, lattice parameter a and differences in aa0. The experimental data of NiO thin films were prepared at several deposition temperatures in the range of 380–460°C. All estimated values of crystallite sizes are proportional to the experimental data. Thus, the measurement of the crystallite size values by this proposed model is compatible with practical measurements qualitative.

eISSN:
1854-7400
Sprache:
Englisch